|
OptoMetrix has recently developed a
technique for localized sampling of material properties in the microwave
regime. This microwave spectroscopy technique was developed under an Airforce
contract to extract microwave properties of stealth materials. With specialized near field probes, the
broadband microwaves from 0.1GHz to 20GHz allow sampling of the
spectrographic properties of the material.
The probe can be scanned over an area to produce an image. Any changes
of the material microwave properties can be detected. A portable test instrument will become available in
late 2004. |
Portable Test Instrument
|