OptoMetrix has joined with MEFAS to offer Failure Analysis testing services utilizing our Laser Signal Injection Microscope.

Services offered include:

·         Device preparation

·         Decapsulation

·         Backside grinding

·         Backside polishing

·         Laser signal injection microscopy using patented XIVA technology

·         Front and backside probing

·         Performs all basic laser signal injection techniques, e.g. OBIC, LIVA, TIVA, SEI

 

 

 

Please call for more information.

Integrated Circuit Failure Analysis Testing Services

To contact us:

Phone: 425-251-6363
Fax: 425-687-1010
Email: optometrix@optomet.com

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Signals are overlaid in blue and red onto the image.  These signals indicate areas for investigation of failures.  At greater magnifications individual faults can be localized.

Signals are seen as black and white spots standing out from a neutral gray background.  Intensity of the white and black indicates the intensity of the signal.

OptoMetrix