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Advanced
LIVA/TIVA Techniques, (ISTFA) International Symposium for
Testing and Failure Analysis 2001
Backside
Thermal Mapping Using Active Laser Probe,
(EDFAN) Electronic Device Failure Analysis News, May 2000
Near
IR Absorption in Heavily Doped Silicon,
(ISTFA) International Symposium for Testing and Failure Analysis 2000
Application
of Near IR, Phase Contrast Imaging to Backside Failure Isolation and
Analysis, (ISTFA) International Symposium for
Testing and Failure Analysis 2000 |
Publications
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To contact us: |
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Phone: 425-251-6363 |