Quarterly Newsletters

2002, Quarter 4
    FA Goes Hollywood
    Spherical Aberration in Backside Imaging
    OptoMetrix Joins with MEFAS to Offer
    LSIM Services

2002, Quarter 3
    OptoMetrix Transmits Music through Digital IC
    Pickup Noise Reduction
    LSIM Mounting Options
        Features and Benefits of OptoMetrix Laser Signal Injection System

2002, Quarter 2
    Demystifying Laser Scanning Techniques
        Two Stimulation Methods and Four Effects
        Detecting the Signal
        Adding Scanning

2002, Quarter 1
    LSM Usability
        Real-Time Focus Aid
        Variable Image Resolution and Region of Interest Selection
        X/Y Scan Interchange
        12 Bit Imaging

2001, Quarter 4
2001, Quarter 2
2001, Quarter 1
   

Publications

        Advanced LIVA/TIVA Techniques, (ISTFA) International Symposium for Testing and Failure Analysis 2001

        Backside Thermal Mapping Using Active Laser Probe, (EDFAN) Electronic Device Failure Analysis News, May 2000

        Near IR Absorption in Heavily Doped Silicon, (ISTFA) International Symposium for Testing and Failure Analysis 2000

        Application of Near IR, Phase Contrast Imaging to Backside Failure Isolation and Analysis, (ISTFA) International Symposium for Testing and Failure Analysis 2000

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