OptoMetrix's Schlieren Thermal
Mapper (STM) uses active optical-
probe techniques to produce both reflected light and Schlieren
(differential phase-contrast) imagery
of an IC.
Thermal map of IC obtained using Schlieren
Thermal Mapper
The Schlieren images are
processed to produce real-time thermal maps with milliKelvin sensitivity and
mega-pixel
resolution. Near infrared (IR)
sources are used for backside probing.
Fault isolation of shorts and thermal management of
"flip-chip" and standard IC's is available in this turnkey system.
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- Differential phase-contrast
imaging of integrated circuit (IC) from the topside or through the backside.
Thermal mapping with milliKelvin sensitivity.
Mega-pixel images with10-bit image depth.
OptoVision instrument control, navigation, image acquisition,
and processing software.
Modular construction allows for future upgrades and custom options.
Long-working distance objectives on motorized turret.
Standard and optional mechanical staging packages.
Schlieren optical head
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